Rxivist logo

Accounting For Technical Noise In Single-Cell RNA Sequencing Analysis

By Cheng Jia, Derek Kelly, Junhyong Kim, Mingyao Li, Nancy R Zhang

Posted 15 Mar 2017
bioRxiv DOI: 10.1101/116939 (published DOI: 10.1093/nar/gkx754)

Recent technological breakthroughs have made it possible to measure RNA expression at the single-cell level, thus paving the way for exploring expression heterogeneity among individual cells. Current single-cell RNA sequencing (scRNA-seq) protocols are complex and introduce technical biases that vary across cells, which can bias downstream analysis without proper adjustment. To account for cell-to-cell technical differences, we propose a statistical framework, TASC (Toolkit for Analysis of Single Cell RNA-seq), an empirical Bayes approach to reliably model the cell-specific dropout rates and amplification bias by use of external RNA spike-ins. TASC incorporates the technical parameters, which reflect cell-to-cell batch effects, into a hierarchical mixture model to estimate the biological variance of a gene and detect differentially expressed genes. More importantly, TASC is able to adjust for covariates to further eliminate confounding that may originate from cell size and cell cycle differences. In simulation and real scRNA-seq data, TASC achieves accurate Type I error control and displays competitive sensitivity and improved robustness to batch effects in differential expression analysis, compared to existing methods. TASC is programmed to be computationally efficient, taking advantage of multi-threaded parallelization. We believe that TASC will provide a robust platform for researchers to leverage the power of scRNA-seq.

Download data

  • Downloaded 1,383 times
  • Download rankings, all-time:
    • Site-wide: 6,298 out of 84,643
    • In bioinformatics: 1,122 out of 8,115
  • Year to date:
    • Site-wide: 40,272 out of 84,643
  • Since beginning of last month:
    • Site-wide: 35,889 out of 84,643

Altmetric data

Downloads over time

Distribution of downloads per paper, site-wide


Sign up for the Rxivist weekly newsletter! (Click here for more details.)